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DeCS
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Descriptor English:
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Microscopy, Electron, Scanning
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Descriptor Spanish:
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Microscopía Electrónica de Rastreo
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Descriptor Portuguese:
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Microscopia Eletrônica de Varredura
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Synonyms English:
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Scanning Electron Microscopy
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Tree Number:
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E01.370.350.515.402.541
E05.595.402.541
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Definition English:
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Microscopy in which the object is examined directly by an electron beam scanning the specimen point-by-point. The image is constructed by detecting the products of specimen interactions that are projected above the plane of the sample, such as backscattered electrons. Although SCANNING TRANSMISSION ELECTRON MICROSCOPY also scans the specimen point by point with the electron beam, the image is constructed by detecting the electrons, or their interaction products that are transmitted through the sample plane, so that is a form of TRANSMISSION ELECTRON MICROSCOPY. |
Indexing Annotation English:
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NIM; do not confuse with MICROSCOPY, ELECTRON, SCANNING TRANSMISSION or STEM; if in doubt, follow words of author; MICROSCOPY, SCANNING TUNNELING is also available
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See Related English:
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Corrosion Casting
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History Note English:
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72(69)
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Allowable Qualifiers English:
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Record Number:
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23316
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Unique Identifier:
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D008855
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Occurrence in VHL:
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Similar:
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DeCS CID-10 SciELO LILACS LIS
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